Mixed-domain simulation of intermodulation in RF-MEMS capacitive shunt switches

被引:0
|
作者
Gaddi, Roberto [1 ]
Iannacci, Jacopo [1 ]
Gnudi, Antonio [1 ]
机构
[1] ARCES-University of Bologna, Viale Risorgimento 2, 40136 Bologna, Italy
来源
关键词
Compendex;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] EMC immunity test for capacitive shunt RF-MEMS switch
    Jmai, Bassem
    Rajhi, Adnen
    Gharsallah, Ali
    2015 16TH INTERNATIONAL CONFERENCE ON SCIENCES AND TECHNIQUES OF AUTOMATIC CONTROL AND COMPUTER ENGINEERING (STA), 2015, : 152 - 157
  • [32] Investigation on Dielectric Material Selection for RF-MEMS Shunt Capacitive Switches Using Ashby, TOPSIS and VIKOR
    Patra, Pritam
    Angira, Mahesh
    TRANSACTIONS ON ELECTRICAL AND ELECTRONIC MATERIALS, 2020, 21 (02) : 157 - 164
  • [33] Investigation on Dielectric Material Selection for RF-MEMS Shunt Capacitive Switches Using Ashby, TOPSIS and VIKOR
    Pritam Patra
    Mahesh Angira
    Transactions on Electrical and Electronic Materials, 2020, 21 : 157 - 164
  • [34] Intermodulation Distortion in MEMS Capacitive Switches under High RF Power
    Molinero, D.
    Palego, C.
    Luo, X.
    Ning, Y.
    Ding, G.
    Hwang, J. C. M.
    Goldmisth, C. L.
    2013 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (IMS), 2013,
  • [35] Surface roughness effects on electromechanical performance of RF-MEMS capacitive switches
    Nawaz, Hamid
    Masood, Muhammad Umar
    Saleem, Muhammad Mubasher
    Iqbal, Javaid
    Zubair, Muhammad
    MICROELECTRONICS RELIABILITY, 2020, 104
  • [36] ANALYTIC MODELING OF RF MEMS SHUNT CONNECTED CAPACITIVE SWITCHES
    Bartolucci, G.
    De Angelis, G.
    Lucibello, A.
    Marcelli, R.
    Proietti, E.
    JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 2012, 26 (8-9) : 1168 - 1179
  • [37] The influence of the package environment on the functioning and reliability of capacitive RF-MEMS switches
    De Wolf, I
    Czarnecki, P
    Jourdain, A
    Modlinski, R
    Tilmans, HAC
    Puers, R
    Van Beek, JTM
    Van Spengen, WM
    MICROWAVE JOURNAL, 2005, 48 (12) : 102 - +
  • [38] Electrostatic discharge and cycling effects on ohmic and capacitive RF-MEMS switches
    Tazzoli, Augusto
    Peretti, Vanni
    Meneghesso, Gaudenzio
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2007, 7 (03) : 429 - 437
  • [39] Spring-constant measurement methods for RF-MEMS capacitive switches
    Wang, Jiahui
    Bielen, Jeroen
    Salm, Cora
    Schmitz, Jurriaan
    2016 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS), 2016, : 10 - 14
  • [40] Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches
    Belarni, A.
    Lamhamdi, M.
    Pons, P.
    Boudou, L.
    Guastavino, J.
    Segui, Y.
    Papaioannou, G.
    Plana, R.
    MICROELECTRONICS RELIABILITY, 2008, 48 (8-9) : 1232 - 1236