Spectroscopy and terahertz imaging for sigillography applications

被引：0
|
作者：
Mounaix, P. [1 ]
Younus, A. [1 ]
Delagnes, J.C. [1 ]
Abraham, E. [1 ]
Canioni, L. [1 ]
Fabre, M. [2 ]
机构：
[1] Laboratoire Ondes et Matière d'Aquitaine, Université de Bordeaux 1, UMR CNRS 5798, 351 Cours de la libération, 33405 Talence Cedex, France
[2] Centre de Recherche Bretonne et Celtique (EA 4451) Université de Bretagne Occidentale, 20 rue Duquesne, 29238 Brest Cedex 3, France
来源：
Journal of the European Optical Society | 2011年 / 6卷
关键词：
Nondestructive examination;
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