TOF-SIMS analysis of the bleeding of organic compounds to pulp fiber surface

被引：0
作者：
Higashi, Hiroto [1 ]
Nakamura, Toko [1 ]
Ornatsu, Masayuki [1 ]
机构：
[1] Material Analysis Center, Oji Paper Co.
来源：
Kami Pa Gikyoshi/Japan Tappi Journal | 2008年 / 62卷 / 02期
关键词：
Bleeding; Pulp; Surface analysis; TOF-SIMS; XPS;
D O I：
10.2524/jtappij.62.196
中图分类号：
学科分类号：
摘要：
It was commonly found that the aging and the manufacturing conditions were influenced on the surface properties of the paper. We assumed that the change of the surface properties was caused by the bleeding of the low-molecular-mass compounds to pulp fiber surface. In order to confirm this assumption we carried out the surface analysis of handsheets using XPS and TOF-SIMS. A handsheet was prepared from a hardwood pulp. TOF-SIMS and XPS analysis showed that the bleedable compounds, such as C-C chemical bonds increase on the surface of the sheet at high temperature.
引用
收藏
页码：82 / 86
页数：4
相关论文
共 50 条
[31]   XPS and ToF-SIMS characterization of a Finemet surface: effect of heating [J].
Chenakin, S. P. ;
Galstyan, G. G. ;
Tolstogouzov, A. B. ;
Kruse, N. .
SURFACE AND INTERFACE ANALYSIS, 2009, 41 (03) :231-237
[32]   XPS and ToF-SIMS characterization of a Finemet surface: effect of cooling [J].
Chenakin, S. P. ;
Vasylyev, M. A. ;
Kruse, N. ;
Tolstogouzov, A. B. .
SURFACE AND INTERFACE ANALYSIS, 2006, 38 (07) :1164-1172
[33]   ToF-SIMS and XPS study of sulphur on carbon black surface [J].
Poleunis, C ;
Vanden Eynde, X ;
Grivei, E ;
Smet, H ;
Probst, N ;
Bertrand, P .
SURFACE AND INTERFACE ANALYSIS, 2000, 30 (01) :420-424
[34]   Quantitative analysis of surface contaminants on silicon wafers by means of TOF-SIMS [J].
Rostam-Khani, P. ;
Philipsen, J. ;
Jansen, E. ;
Eberhard, H. ;
Vullings, P. .
APPLIED SURFACE SCIENCE, 2006, 252 (19) :7255-7257
[35]   Examination of the interface of a model adhesive joint by surface analysis: a study by XPS and ToF-SIMS [J].
Abel, Marie-Laure ;
Watts, John F. .
SURFACE AND INTERFACE ANALYSIS, 2009, 41 (06) :508-516
[36]   Copper surface analysis with ToF-SIMS: spectra interpretation and stability issues [J].
Trouiller, Q. ;
Petitdidier, S. ;
Ravanel, X. ;
Broussous, L. ;
Juhel, M. ;
Kwakman, L. F. Tz. ;
Wyon, C. .
ULTRA CLEAN PROCESSING OF SEMICONDUCTOR SURFACES VIII, 2008, 134 :371-+
[37]   Surface analysis of diblock copolymer films by TOF-SIMS in combination with AFM [J].
Lee, Jihye ;
Shin, Kwanwoo ;
Lee, Kang-Bong ;
Lee, Yeonhee .
SURFACE AND INTERFACE ANALYSIS, 2014, 46 :87-91
[38]   Applications of ToF-SIMS in Surface Chemistry Analysis of Lignocellulosic Biomass: A Review [J].
Mou, Hong Yan ;
Wu, Shubin ;
Fardim, Pedro .
BIORESOURCES, 2016, 11 (02) :5581-5599
[39]   Tribological characterisation of an organic coating by the use of ToF-SIMS [J].
Bexell, U ;
Carlsson, P ;
Olsson, A .
APPLIED SURFACE SCIENCE, 2003, 203 :596-599
[40]   Ageing studies of plasma deposited organic films by surface chemical analysis (ESCA, TOF-SIMS, XAS) [J].
Unger, W. E. S. ;
Oran, U. ;
Swaraj, S. ;
Lippitz, A. .
THERMEC 2006, PTS 1-5, 2007, 539-543 :623-+
12345