共 49 条
- [46] Erratum: Border trap evaluation for SiO2/GeO2/Ge gate stacks using deep-level transient spectroscopy (J. Appl. Phys. (2018) 124 (205303) DOI: 10.1063/1.505529) Journal of Applied Physics, 2020, 127 (16):
- [47] Erratum: Structural, electronic, and optical properties of ferroelectric KTa1/2Nb1/2O3 solid solutions (J. Appl. Phys. (2008) 103 (074113) DOI: 10.1063/1.2902433) Journal of Applied Physics, 2021, 130 (10):
- [48] Erratum: Ultra-high temporal resolution images of a homogeneous electric field short air gap negative streamer at overvoltage and atmospheric pressure (Jpn. J. Appl. Phys. (2024) 63 (060902) DOI: 10.35848/1347-4065/ad51bd) Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1600, 63 (07):
- [49] Erratum: Relationship between surface free energy and development process (swelling and dissolution kinetics) of poly(4-hydroxystyrene) film in water and 2.38 wt% tetramethylammonium hydroxide aqueous solution (Jpn. J. Appl. Phys. (2022) 61 (016502) DOI: 10.35848/1347-4065/ac3d42) Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2024, 63 (08):