It has been well known that the achievable rate of multiuser multiple-input multiple-output systems with limited feedback is severely degraded by quantization errors when the number of feedback bits is not sufficient. To overcome such a rate degradation, we propose new robust precoding designs which can compensate for the quantization errors. In this paper, we first analyze the achievable rate of traditional precoding designs for limited feedback systems. Then, we obtain an approximation of the second-order statistics of quantized channel state information. With the aid of the derived approximation, we propose robust precoding designs in terms of the mean square error (MSE) with conditional expectation in non-iterative and iterative fashions. For the non-iterative precoding design, we study a robust minimum MSE (MMSE) precoding algorithm by extending a new channel decomposition. Also, in the case of iterative precoding, we investigate a robust weighted MMSE (WMMSE) precoding to further improve the achievable rate. Simulation results show that the proposed precoding schemes yield significant improvements over traditional precoding designs.
机构:
Indian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
University of Luxembourg, Interdisciplinary Center of Security Reliability and Trust (SnT), KirchbergIndian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
Rajput K.P.
;
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机构:
Srivastava S.
;
Venkategowda N.K.D.
论文数: 0引用数: 0
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机构:
Linköping University, Department of Science and Technology, NorrköpingIndian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
Venkategowda N.K.D.
;
Jagannatham A.K.
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机构:
Indian Institute of Technology Kanpur, Department of Electrical Engineering, KanpurIndian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
Jagannatham A.K.
;
Hanzo L.
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机构:
University of Southampton, School of Electronics and Computer Science, SouthamptonIndian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
机构:
Indian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
University of Luxembourg, Interdisciplinary Center of Security Reliability and Trust (SnT), KirchbergIndian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
Rajput K.P.
;
论文数: 引用数:
h-index:
机构:
Srivastava S.
;
Venkategowda N.K.D.
论文数: 0引用数: 0
h-index: 0
机构:
Linköping University, Department of Science and Technology, NorrköpingIndian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
Venkategowda N.K.D.
;
Jagannatham A.K.
论文数: 0引用数: 0
h-index: 0
机构:
Indian Institute of Technology Kanpur, Department of Electrical Engineering, KanpurIndian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur
Jagannatham A.K.
;
Hanzo L.
论文数: 0引用数: 0
h-index: 0
机构:
University of Southampton, School of Electronics and Computer Science, SouthamptonIndian Institute of Technology Kanpur, Department of Electrical Engineering, Kanpur