Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

被引：6
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作者：
机构：
[1] Lagerpusch, Ulrike
[2] Anczykowski, Boris
[3] Nembach, Eckhard
来源：
Nembach, E. (nembach@nwz.uni-muenster.de) | 2001年 / Taylor and Francis Ltd.卷 / 81期
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D O I：
10.1080/01418610110043136
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