IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India: Guest editorial
被引:0
|
作者:
Verma, Ajit K.
论文数: 0引用数: 0
h-index: 0
机构:
Reliability Engineering Group, Department of Electrical Engineering, Indian Inst. of Technology Bombay, Powai, Mumbai 400 076, IndiaReliability Engineering Group, Department of Electrical Engineering, Indian Inst. of Technology Bombay, Powai, Mumbai 400 076, India
Verma, Ajit K.
[1
]
Srividya, A.
论文数: 0引用数: 0
h-index: 0
机构:
Reliability Engineering Group, Department of Electrical Engineering, Indian Inst. of Technology Bombay, Powai, Mumbai 400 076, IndiaReliability Engineering Group, Department of Electrical Engineering, Indian Inst. of Technology Bombay, Powai, Mumbai 400 076, India
Srividya, A.
[1
]
机构:
[1] Reliability Engineering Group, Department of Electrical Engineering, Indian Inst. of Technology Bombay, Powai, Mumbai 400 076, India
机构:
Department of Mechanical Engineering, Division of Mechanical, Medical and Aerospace Engineering, University of Surrey, United KingdomDepartment of Mechanical Engineering, Division of Mechanical, Medical and Aerospace Engineering, University of Surrey, United Kingdom
Chew, John
Robins, Alan
论文数: 0引用数: 0
h-index: 0
机构:
Department of Environmental Fluid Dynamics, Division of Mechanical, Medical and Aerospace Engineering, University of Surrey, United KingdomDepartment of Mechanical Engineering, Division of Mechanical, Medical and Aerospace Engineering, University of Surrey, United Kingdom