Impact of charge carrier trapping on amorphous selenium direct conversion avalanche X-ray detectors

被引：0
|
作者：
Arnab, Salman M. [1 ]
Kabir, M.Z. [1 ]
机构：
[1] Department of Electrical and Computer Engineering, Concordia University, 1455 De Maisonneuve Blvd. West, Montréal,QC,H3G 1M8, Canada
来源：
Journal of Applied Physics | 2017年 / 122卷 / 13期
关键词：
Pixels;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Measurement of X-ray photogeneration in amorphous selenium
    Blevis, I.M.
    Hunt, D.C.
    Rowlands, J.A.
    Journal of Applied Physics, 85 (11):
  • [42] The x-ray sensitivity of amorphous selenium for mammography
    Stone, MF
    Zhao, W
    Jacak, BV
    O'Connor, P
    Yu, B
    Rehak, P
    MEDICAL PHYSICS, 2002, 29 (03) : 319 - 324
  • [43] Measurement of x-ray photogeneration in amorphous selenium
    Blevis, IM
    Hunt, DC
    Rowlands, JA
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (11) : 7958 - 7963
  • [44] Evaluation of organic perovskite photoconductors for direct conversion X-ray imaging detectors
    Dhilippan M. Panneerselvam
    M. Z. Kabir
    Journal of Materials Science: Materials in Electronics, 2017, 28 : 7083 - 7090
  • [45] Characterization of polycrystalline lead oxide for application in direct conversion X-ray detectors
    O. Semeniuk
    O. Grynko
    G. Decrescenzo
    G. Juska
    K. Wang
    A. Reznik
    Scientific Reports, 7
  • [46] Focal Spot Deblurring for High Resolution Direct Conversion X-ray Detectors
    Nagesh, S. V. Setlur
    Rana, R.
    Russ, M.
    Ionita, Ciprian N.
    Bednarek, D. R.
    Rudin, S.
    MEDICAL IMAGING 2016: PHYSICS OF MEDICAL IMAGING, 2016, 9783
  • [47] Characterization of Thick Films of Cadmium Telluride for Direct Conversion X-ray Detectors
    Kim, Seo-Han
    Lee, Gun-Hwan
    Song, Pung-Keun
    SCIENCE OF ADVANCED MATERIALS, 2016, 8 (09) : 1799 - 1808
  • [48] Characterization of polycrystalline lead oxide for application in direct conversion X-ray detectors
    Semeniuk, O.
    Grynko, O.
    Decrescenzo, G.
    Juska, G.
    Wang, K.
    Reznik, A.
    SCIENTIFIC REPORTS, 2017, 7
  • [49] Evaluation of organic perovskite photoconductors for direct conversion X-ray imaging detectors
    Panneerselvam, Dhilippan M.
    Kabir, M. Z.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2017, 28 (10) : 7083 - 7090
  • [50] Direct-conversion flat-panel X-ray image detectors
    Kasap, SO
    Rowlands, JA
    IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, 2002, 149 (02): : 85 - 96
12345