Impact of charge carrier trapping on amorphous selenium direct conversion avalanche X-ray detectors

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作者：
Arnab, Salman M. [1 ]
Kabir, M.Z. [1 ]
机构：
[1] Department of Electrical and Computer Engineering, Concordia University, 1455 De Maisonneuve Blvd. West, Montréal,QC,H3G 1M8, Canada
来源：
Journal of Applied Physics | 2017年 / 122卷 / 13期
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