An RFID-based manufacture process control and supply chain management in the semiconductor industry

被引：1
|
作者：
Tsai, Yung-Shun [1 ]
Chen, Ruey-Shun [2 ]
Chen, Yeh-Cheng [3 ]
Yeh, Chun-Ping [1 ]
机构：
[1] Institute of Information Management, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, Taiwan
[2] Department of Information Management, China University of Technology, 530 Sec. 3 Chung Shan Road, Hukou, Hsinchu, Taiwan
[3] Department of Computer Science and Information Engineering, National Cheng-Kung University, No. 1, University Road, Tainan City 701, Taiwan
来源：
International Journal of Information Technology and Management | 2013年 / 12卷 / 1-2期
关键词：
Information management systems - Information transmission - Inventory management - Manufacture process - Semiconductor industry - Semiconductor manufacturing - Semiconductor tests - Warehouse management;
D O I：
10.1504/IJITM.2013.051633
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：85 / 105
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