Detection of nanopores with the scanning ion conductance microscopy: A simulation study

被引：0
作者：
Qiu, Yinghua [1 ,2 ,3 ]
Ma, Long [2 ,3 ]
Liu, Zhe [2 ,3 ]
Zhang, Hongwen [2 ,3 ]
Ai, Bowen [2 ,3 ]
Tu, Xinman [1 ]
机构：
[1] Nanchang Hangkong Univ, Key Lab Jiangxi Prov Persistent Pollutants Control, Nanchang 330063, Jiangxi, Peoples R China
[2] Shandong Univ, Natl Demonstrat Ctr Expt Mech Engn Educ, Key Lab High Efficiency & Clean Mech Manufacture, Sch Mech Engn,Minist Educ, Jinan 250061, Peoples R China
[3] Shandong Univ, Shenzhen Res Inst, Shenzhen 518000, Guangdong, Peoples R China
来源：
CHEMICAL PHYSICS LETTERS | 2024年 / 856卷
基金：
美国国家科学基金会;
关键词：
Nanopore detection; Multipore membrane; Electric double layers; Scanning ion conductance microscopy; NANOSCALE SURFACE-CHARGE; SOLID-STATE NANOPORES; FABRICATION; TRANSPORT; RECTIFICATION; NANOPARTICLES; MOLECULES; SIZE;
D O I：
10.1016/j.cplett.2024.141668
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
During the dielectric breakdown process of thin solid-state nanopores, the application of high voltages may cause the formation of multi-nanopores on one chip, which number and sizes are important for their applications. Here, simulations were conducted to mimic the investigation of in situ nanopore detection with scanning ion conductance microscopy (SICM). Results show that SICM can provide accurate nanopore location and relative pore size. Detection resolution is influenced by the dimensions of the applied probe and separation between the probe and membranes, which can be enhanced under large voltages or a concentration gradient.
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页数：8
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