Crystallographic analysis of CoPtCr-Si O2 perpendicular recording media with high anisotropy using synchrotron radiation x-ray diffraction

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[1] Kubo, T.
[2] Kuboki, Y.
[3] Ohsawa, M.
[4] Tanuma, R.
[5] Saito, A.
[6] Oikawa, T.
[7] Uwazumi, H.
[8] Shimatsu, T.
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Kubo, T. | 1600年 / American Institute of Physics Inc.卷 / 97期
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Number:; RR2002; Acronym:; -; Sponsor:; Monbusho; Sponsor: Ministry of Education; Culture; Sports; Science and Technology;
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