Visual software defect prediction method based on improved recurrent criss-cross residual network

被引：0
|
作者：
Chen, Liqiong [1 ]
Yunjie, Lei [1 ]
Huaiying, Sun [1 ]
机构：
[1] Shanghai Institute of Technology, Shanghai, China
来源：
International Journal of Web Information Systems | / 20卷 / 06期
关键词：
Engineering Village;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Activation functions - Attention mechanisms - Deep learning - Residual network - Sample quality - Sample sizes - Software defect prediction - Training sample - Visual software defect prediction - Weighted activation function
引用
收藏
页码：621 / 638
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