Visual software defect prediction method based on improved recurrent criss-cross residual network

被引：0

作者：

Chen, Liqiong ^{[1
]}

Yunjie, Lei ^{[1
]}

Huaiying, Sun ^{[1
]}

机构：

[1] Shanghai Institute of Technology, Shanghai, China

来源：

International Journal of Web Information Systems | / 20卷 / 06期

关键词：

Engineering Village;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Activation functions - Attention mechanisms - Deep learning - Residual network - Sample quality - Sample sizes - Software defect prediction - Training sample - Visual software defect prediction - Weighted activation function

引用

页码：621 / 638

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