Variable range hopping in thin film with large dielectric constant

被引:0
作者
机构
[1] Shklovskii, B.I.
来源
Shklovskii, B.I. (shklovsk@physics.umn.edu) | 1600年 / Institute for Low Temperature Physics and Engineering卷 / 43期
关键词
Thin films;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Thin dielectric film thickness determination by advanced transmission electron microscopy
    Diebold, AC
    Foran, B
    Kisielowski, C
    Muller, DA
    Pennycook, SJ
    Principe, E
    Stemmer, S
    MICROSCOPY AND MICROANALYSIS, 2003, 9 (06) : 493 - 508
  • [22] Infrared Dielectric Mirrors Based on Thin Film Multilayers of Polystyrene and Polyvinylpyrrolidone
    Bailey, James
    Sharp, James S.
    JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 2011, 49 (10) : 732 - 739
  • [23] Sensitivity of variable angle spectroscopic ellipsometry to isotropic thin film properties
    Urban, FK
    Barton, D
    THIN SOLID FILMS, 1997, 308 : 31 - 37
  • [24] First principles study and variable range hopping conductivity in disordered Al/Ti/Mn-doped ZnO
    Plugaru, Rodica
    Sandu, Titus
    Plugaru, Neculai
    RESULTS IN PHYSICS, 2012, 2 : 190 - 197
  • [25] High-temperature anomalies of dielectric constant in TiO2 thin films
    Bessergenev, Valentin
    MATERIALS RESEARCH BULLETIN, 2009, 44 (08) : 1722 - 1728
  • [26] Determination of dielectric constant and loss of high-K thin films in the microwave frequencies
    Sudheendran, K.
    Pamu, D.
    Krishna, M. Ghanashyam
    Raju, K. C. James
    MEASUREMENT, 2010, 43 (04) : 556 - 562
  • [27] Non-Destructive Measurements of Dielectric Constant of Thin dielectric Films with metallic backing using Coplanar transmission line
    Kassem, Hussein
    Vigneras, Valerie
    2016 3RD INTERNATIONAL CONFERENCE ON ADVANCES IN COMPUTATIONAL TOOLS FOR ENGINEERING APPLICATIONS (ACTEA), 2016, : 58 - 61
  • [28] Double modulated differential THz-TDS for thin film dielectric characterization
    Mickan, SP
    Lee, KS
    Lu, TM
    Munch, J
    Abbott, D
    Zhang, XC
    MICROELECTRONICS JOURNAL, 2002, 33 (12) : 1033 - 1042
  • [29] Effect of film thickness on the dielectric properties and charge storage in PMMA thin films
    Orrit-Prat, Jordi
    Boudou, Laurent
    Villeneuve, Christina
    Teyssedre, Gilbert
    Behar, Samuel
    Ressier, Laurence
    Diaz, Regis
    PROCEEDINGS OF THE 2013 IEEE INTERNATIONAL CONFERENCE ON SOLID DIELECTRICS (ICSD 2013), VOLS 1 AND 2, 2013, : 350 - 353
  • [30] Characterization and dielectric properties of vacuum-deposited zinc phthalocyanine thin film
    Kaur, Manjit
    Kumar, Rajesh
    Dogra, Rakesh
    Arora, Narinder
    Sharma, Navjeet
    SURFACE INNOVATIONS, 2018, 6 (1-2) : 63 - 70