Comparative Reliability Analysis for Resonant Converter Operation Under Component Ageing

被引:4
作者
Neacsu, Dorin O. [1 ]
Cirstea, Marcian N. [2 ]
Butnicu, Dan [1 ]
机构
[1] Tech Univ Iasi, Iasi 700050, Romania
[2] Anglia Ruskin Univ, Cambridge CB1 1PT, England
来源
IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN INDUSTRIAL ELECTRONICS | 2021年 / 2卷 / 02期
关键词
Buck converter; computer-aided analysis; reliability; resonant converter; thermal stress; POWER CONVERTER; ELECTRONICS;
D O I
10.1109/JESTIE.2020.3044515
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article is concerned with reliability analysis in relation to optimal switching of resonant power converters, aimed at minimizing their power loss and operational temperature and, thus, reducing their lifetime degradation. In most cases, high-performance resonant converter control requires a continuous adaptation of the power device switching instances depending on the power input source, load current, or parameter variation in passive components. If the resonant converter is switched before or after the resonant swing ends, more loss is added to the system, with effects in operating temperature rise and reliability deterioration. Even if the switching frequency is adjusted to keep the output voltage constant, itmay influence the operational temperature. This article is quantifying this problem with a calculation of the lifetime implication for both cases of zero voltage transition (ZVT) and zero current transition (ZCT) buck converters. Abroad range of parameter variation in passive components is considered due to ageing or aggravated stress. A thorough performance (lifetime/reliability) evaluation is achieved through a comparative analysis of results obtained for resonant converters with ideal operation, resonant converters with adjusted timing due to parameter variation, and hard-switched converters without any resonance. Conclusions are formulated in the end. The results reported in this article should be of high interests to the power electronics community, given that resonant converters are used in a wide range of applications due to their ability to reduce power semiconductor losses.
引用
收藏
页码:142 / 154
页数:13
相关论文
共 35 条
[1]  
[Anonymous], 1991, Military Handbook - Reliability prediction of electronic equipment
[2]  
[Anonymous], Document 1192-1
[3]  
[Anonymous], 2019, PSIM webpage
[4]  
[Anonymous], 2020, Circuit's designer notebook-Dielectric ageing phenomena
[5]  
[Anonymous], 2006, Tech. Rep., Application note AN0006 Knowles
[6]  
[Anonymous], 2004, 62380 IEC TR
[7]  
Blaabjerg F, 2012, PROC IEEE INT SYMP, P19, DOI 10.1109/ISIE.2012.6237053
[8]  
Bourbouse Stefanie, 2019, Introduction to the FIDES method in the frame of its application to Space
[9]   A Reliability Comparison between Disrupting eGaN-FET and Cutting Edge Silicon MOSFET Devices in POL Buck Converters [J].
Butnicu, Dan .
2019 INTERNATIONAL SYMPOSIUM ON SIGNALS, CIRCUITS AND SYSTEMS (ISSCS 2019), 2019,
[10]   A Case Study for Reliability Evaluation of an External Computer Power Supply [J].
Butnicu, Dan ;
Neacsu, Dorin O. .
ELECTRIC POWER COMPONENTS AND SYSTEMS, 2019, 47 (4-5) :444-455