Learning acyclic probabilistic circuits using test paths

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Department of Computer Science, Yale University, New Haven, CT 06520, United States [1 ]
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不详 [3 ]
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J. Mach. Learn. Res. | / 1881-1911期
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Compilation and indexing terms; Copyright 2024 Elsevier Inc;
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摘要：
Polynomial approximation - Wire - Timing circuits - Bayesian networks - Statistical tests
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