Transmission secondary ion mass spectrometry of a peptide using 5 MeV C60+ ions

被引：0

作者：

Nakajima K. ^{[1
]}

机构：

[1] Dept. of Micro Engineering, Kyoto University, Kyoto daigaku-katsura, Nishikyo-ku, Kyoto

来源：

Nakajima, Kaoru (kaoru@kues.kyoto-u.ac.jp) | 1600年 / Institute of Electrical Engineers of Japan卷 / 137期

关键词：

C[!sub]60[!/sub; Leucine-enkephalin; Peptide; SIMS;

D O I：

10.1541/ieejeiss.137.411

中图分类号：

学科分类号：

摘要：

Transmission secondary ion mass spectrometry (transmission SIMS) of thin films of leucine-enkephalin using MeV C60+ primary ions was performed to examine the advantage of the combination with detection of secondary ions emitted in the forward direction in efficient emission of the intact molecular ions. Leucine-enkephalin thin films deposited on self-supporting SiN membranes were bombarded with 5 MeV C60 ions, and positive secondary ions emitted in the forward and backward directions were mass-analyzed. The yield of fragment ions emitted in the forward direction was remarkably reduced compared to the backward direction, while the yield of intact molecular ions was reduced to a minor extent depending on the thickness of the peptide film. This suggests a potential of forward emission geometry in transmission cluster ion SIMS for less-damage and sensitive analysis of biological materials. © 2017 The Institute of Electrical Engineers of Japan.

引用

页码：411 / 417

页数：6

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