Near-edge X-ray absorption fine structure studies of Cr1-xM xN coatings

被引:0
|
作者
Mahbubur Rahman, M. [1 ,8 ]
Duan, Alex [2 ]
Jiang, Zhong-Tao [1 ]
Xie, Zonghan [3 ,7 ]
Wu, Alex [2 ]
Amri, Amun [4 ]
Cowie, Bruce [5 ]
Yin, Chun-Yang [6 ]
机构
[1] School of Engineering and Information Technology, Murdoch University, Murdoch, WA 6150, Australia
[2] School of Chemistry, University of Melbourne, Parkville, VIC 3010, Australia
[3] School of Mechanical Engineering, University of Adelaide, SA 5005, Australia
[4] Department of Chemical Engineering, Riau University, Pekanbaru, Indonesia
[5] Australian Synchrotron, 800 Blackburn Rd., Clayton, VIC 3168, Australia
[6] Chemical and Analytical Sciences, Murdoch University, Murdoch, WA 6150, Australia
[7] School of Engineering, Edith Cowan University, WA 6027, Australia
[8] Department of Physics, Jahangirnagar University, Savar, Dhaka 1342, Bangladesh
关键词
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
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学科分类号
摘要
Auger electron spectroscopy - Oxidation resistance - Electronic structure - Aluminum coatings - X ray absorption - Atomic physics - Crystal atomic structure
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页码:362 / 368
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