Real-time x-ray diffraction at the impact surface of shocked crystals

X-ray diffraction (XRD) measurements at the impact surface, rather than the rear surface, of a shocked crystal have two important advantages: time-dependent material response can be directly monitored and the shocked crystal may be examined in a constant state over a continuous range of peak stresses. Methods for obtaining XRD data at the impact surface of crystals impacting an x-ray window are presented. Quantitative accuracy of the impact surface XRD method was established using Si(100) shocked elastically to 5.4 GPa. For Si(100) shocked inelastically to 12.2 GPa, partial strength loss occurred and the lattice strain and orientation became quite heterogeneous. © 2012 American Institute of Physics.