LIGHT/CURRENT-INDUCED DEGRADATION OF CRYSTALLINE SILICON PHOTOVOLTAIC MODULES UNDER DIFFERENT TEMPERATURES

被引：0

作者：

Zhu B. ^{[1
]}

Song H. ^{[1
]}

Chen H. ^{[1
]}

Huai C. ^{[1
]}

Hu D. ^{[1
]}

He Y. ^{[2
]}

机构：

[1] Wuxi Institute of Inspection，Testing and Certification, Wuxi

[2] Zhejiang Beyondsun PV Co.，Ltd., Huzhou

来源：

Taiyangneng Xuebao/Acta Energiae Solaris Sinica | 2023年 / 44卷 / 06期

关键词：

carrier injection; high temperature; light/current-induced degradation; PV modules; reliability;

D O I：

10.19912/j.0254-0096.tynxb.2022-0111

中图分类号：

学科分类号：

摘要：

There are various light/current-induced degradation mechanisms for crystalline silicon photovoltaic modules. In order to study the effects of different degradation conditions on degradation mechanisms，different degradation tests were carried out in this article. The test results were analyzed. It is found that all types of modules have light/current-induced degradation. Compared with PERC solar cell，TOPCon module has slower degradation rate and has longest stable period in LID experiment. After LID test，all types of modules still occur high temperature degradation. By analyzing the degradation data of CID and LeTID tests it is found that the power degradation is positively correlated with the change of fill factors. This study is helpful to further understand the degradtion mechanism of photovoltaic modules and provides reference for the formulation of laboratory testing methods. © 2023 Science Press. All rights reserved.

引用

页码：227 / 233

页数：6

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