BINoculars: Data reduction and analysis software for two-dimensional detectors in surface X-ray diffraction

被引:0
|
作者
20153101104946
机构
[1] [1,Roobol, Sander
[2] 1,Onderwaater, Willem
[3] Drnec, Jakub
[4] Felici, Roberto
[5] 1,Frenken, Joost
来源
Roobol, Sander (binoculars@uithetblauw.nl) | 1600年 / International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom卷 / 48期
关键词
21;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] Nika: software for two-dimensional data reduction
    Ilavsky, Jan
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2012, 45 : 324 - 328
  • [42] EXPERIMENTAL AND THEORETICAL TWO-DIMENSIONAL X-RAY PHOTOELECTRON DIFFRACTION PATTERNS FROM GAAS(001) SURFACE
    OWARI, M
    KUDO, M
    NIHEI, Y
    KAMADA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (06): : L394 - L396
  • [43] X-RAY DIFFRACTION ANALYSIS .3. DETECTORS
    RUDMAN, R
    JOURNAL OF CHEMICAL EDUCATION, 1967, 44 (03) : A187 - &
  • [44] Amorphous orientation in polymers determined using two-dimensional x-ray diffraction data and its significance
    Murthy, NS
    Zero, K
    ANTEC '99: PLASTICS BRIDGING THE MILLENNIA, CONFERENCE PROCEEDINGS, VOLS I-III: VOL I: PROCESSING; VOL II: MATERIALS; VOL III: SPECIAL AREAS;, 1999, : 1672 - 1676
  • [45] Processing two-dimensional X-ray diffraction and small-angle scattering data in DAWN 2
    Filik, J.
    Ashton, A. W.
    Chang, P. C. Y.
    Chater, P. A.
    Day, S. J.
    Drakopoulos, M.
    Gerring, M. W.
    Hart, M. L.
    Magdysyuk, O. V.
    Michalik, S.
    Smith, A.
    Tang, C. C.
    Terrill, N. J.
    Wharmby, M. T.
    Wilhelm, H.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2017, 50 : 959 - 966
  • [46] Two-dimensional energy dispersive x-ray diffraction at high pressures and temperatures
    Ma, YZ
    Mao, HK
    Hemley, RJ
    Gramsch, SA
    Shen, GY
    Somayazulu, M
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (02): : 1302 - 1305
  • [47] Denoising X-Ray Diffraction Two-Dimensional Patterns with Lattice Boltzmann Method
    Ladisa, Massimo
    CRYSTALS, 2025, 15 (01)
  • [48] Mapping two-dimensional state of strain using synchroton X-ray diffraction
    Korsunsky, AM
    Wells, KE
    Withers, PJ
    SCRIPTA MATERIALIA, 1998, 39 (12) : 1705 - 1712
  • [49] Two-dimensional correlation analysis for x-ray photoelectron spectroscopy
    Li, S.
    Driver, T.
    Al Haddad, A.
    Champenois, E. G.
    Agaker, M.
    Alexander, O.
    Barillot, T.
    Bostedt, C.
    Garratt, D.
    Kjellsson, L.
    Lutman, A. A.
    Rubensson, J-E
    Sathe, C.
    Marinelli, A.
    Marangos, J. P.
    Cryan, J. P.
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2021, 54 (14)