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- [7] The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2011, 44 : 241 - 246
- [9] Integration techniques for surface X-ray diffraction data obtained with a two-dimensional detector Drnec, J. (drnec@esrf.fr), 1600, International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom (47):
- [10] Stress and texture analysis with two-dimensional x-ray diffraction ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2002, 404-7 : 109 - 114