A method of determining EMCCD electron multiplication gain

被引:0
|
作者
Lu, Jia-Li [1 ]
Li, Bin-Hua [1 ]
Hu, Po [1 ]
机构
[1] Faculty of Information Engineering and Automation, Kunming University of Science and Technology, Kunming,Yunnan,650500, China
来源
Binggong Xuebao/Acta Armamentarii | 2015年 / 36卷 / 04期
关键词
Electrons - Electron multipliers;
D O I
10.3969/j.issn.1000-1093.2015.04.020
中图分类号
学科分类号
摘要
The electron multiplication gain needs to be corrected during operation of the EMCCD camera. According to the structural characteristics of the electron multiplying CCD and the charge multiplication of the single stage multiplier, the limitation of the existing multiplication model has to be analyzed in practical application. For TI EMCCD devices, the key parameters, including the operation voltage and temperature of EMCCD, of original multiplication model can be derived by simulation, a mathematical equation of the parameters is also presented by multiple regression analysis. And then the equation is introduced into the model, and a new method for determining the EMCCD gain is obtained, which is universal and simpler. It expands the application range of the original multiplication model. The simulation results of the model agree well with the actual data of EMCCD device. It shows that, the gain model is convenient for calculating the electron multiplier average gain as the charge multiplication gate voltage is changed. ©, 2015, China Ordnance Society. All right reserved.
引用
收藏
页码:710 / 715
相关论文
共 50 条
  • [1] A method for EMCCD multiplication gain measurement with comprehensive correction
    Qiao, Li
    Wang, Mingfu
    Jin, Zheng
    SCIENTIFIC REPORTS, 2021, 11 (01)
  • [2] A method for EMCCD multiplication gain measurement with comprehensive correction
    Li Qiao
    Mingfu Wang
    Zheng Jin
    Scientific Reports, 11
  • [3] Study on Sine-wave Driving Circuits for EMCCD and Its Electron Multiplication Gain
    Zhang, Yugui
    Li, Tao
    He, Zhikuan
    Han, Zhixue
    EQUIPMENT MANUFACTURING TECHNOLOGY AND AUTOMATION, PTS 1-3, 2011, 317-319 : 1062 - 1067
  • [4] Electron multiplication model of EMCCD in low temperature
    Li, B.-H. (lbh@bao.ac.cn), 1826, Chinese Institute of Electronics (41):
  • [5] A gain series method for accurate EMCCD calibration
    Duncan P. Ryan
    Megan K. Dunlap
    Martin P. Gelfand
    James H. Werner
    Alan K. Van Orden
    Peter M. Goodwin
    Scientific Reports, 11
  • [6] A gain series method for accurate EMCCD calibration
    Ryan, Duncan P.
    Dunlap, Megan K.
    Gelfand, Martin P.
    Werner, James H.
    Van Orden, Alan K.
    Goodwin, Peter M.
    SCIENTIFIC REPORTS, 2021, 11 (01)
  • [7] EMCCD Gain estimation: a comparison of techniques
    Devaney, Nicholas
    McErlean, Donal
    Shearer, Andrew
    Colleary, Cian
    X-RAY, OPTICAL, AND INFRARED DETECTORS FOR ASTRONOMY XI, 2024, 13103
  • [8] New ultra-high speed CCD camera achieves sub-electron read noise using on-chip multiplication gain (EMCCD) technology
    Guntupalli, R
    Hagan, V
    Cooper, A
    Simpson, R
    26th International Congress on High Speed Photography and Photonics, 2005, 5580 : 905 - 912
  • [9] Life testing of EMCCD gain characteristics
    Ingley, Richard
    Smith, David R.
    Holland, Andrew D.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2009, 600 (02): : 460 - 465
  • [10] Gain and noise analysis of an intensified EMCCD
    Xi Xiaoqi
    Zhao Junyu
    Zang Qing
    Han Xiaofeng
    Dai Xingxing
    Yang Jianhua
    Zhang Lili
    Li Mengting
    INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2011: ADVANCES IN IMAGING DETECTORS AND APPLICATIONS, 2011, 8194