X-ray topographic study of SiC crystal at high temperature

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[1] Yamaguchi, H.
[2] Oyanagi, N.
[3] Kato, T.
[4] Takano, Y.
[5] Nishizawa, S.
[6] Bahng, W.
[7] 1,Yoshida, S.
[8] Arai, K.
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Yamaguchi, H. | 2000年 / Trans Tech Publ Ltd, Uetikon-Zuerich, Switzerland卷 / 338期
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