Split-post and split-cylinder resonator techniques: A comparison of complex permittivity measurement of dielectric substrates

被引：0

作者：

Janezic, Michael D. ^{[1
]}

Krupka, Jerzy ^{[2
]}

机构：

[1] Electromagnetics Division, National Institute of Standards and Technology, Boulder, CO 80305, United States

[2] Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, Warsaw, Poland

来源：

Journal of Microelectronics and Electronic Packaging | 2009年 / 6卷 / 02期

关键词：

Compendex;

D O I：

10.4071/1551-4897-6.2.97

中图分类号：

学科分类号：

摘要：

Permittivity

引用

页码：97 / 100