A method of fault diagnosis for analog circuit based on KELM

被引：0
|
作者：
Chen, Shaowei [1 ]
Liu, Guangfeng [1 ]
Ye, Shuai [1 ]
机构：
[1] Department of Electronics Engineering, Northwestern Polytechnical University, Xi'an,710072, China
来源：
Xibei Gongye Daxue Xuebao/Journal of Northwestern Polytechnical University | 2015年 / 33卷 / 02期
关键词：
Analog circuit fault diagnosis - Circuit under test - Extreme learning machine - Fast learning - Fault signature - Kernel function - Soft sensor models - Solution process;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：290 / 294
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