Rydberg atom-based microwave electrometry using polarization spectroscopy

被引:0
作者
Gomes, Naomy Duarte [1 ]
Pepino, Vinicius Marrara [2 ]
Borges, Ben-Hur Viana [2 ]
Magalhaes, Daniel Varela [1 ]
Napolitano, Reginaldo de Jesus [1 ]
Torres, Manuel Alejandro Lefran [1 ]
Massayuki Kondo, Jorge Douglas [3 ]
Marcassa, Luis Gustavo [1 ]
机构
[1] Univ Sao Paulo, Inst Fis Sao Carlos, Caixa Postal 369, BR-13560970 Sao Carlos, SP, Brazil
[2] Univ Sao Paulo, Dept Engn Elect & Computacao, Escola Engn Sao Carlos, Sao Carlos, Brazil
[3] Univ Fed Santa Catarina, Dept Fis, BR-88040900 Florianopolis, SC, Brazil
基金
巴西圣保罗研究基金会;
关键词
EIT; polarization spectroscopy; microwave electrometry; ELECTROMAGNETICALLY INDUCED TRANSPARENCY; STATE;
D O I
10.1088/1361-6455/ad8a34
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this study, we investigated Rydberg atom-based microwave (MW) electrometry using polarization spectroscopy in a room-temperature vapor cell. By measuring Autler-Townes splitting in the electromagnetically induced transparency (EIT) spectrum, we determined that the minimum measurable MW electric field is approximately five times lower than conventional EIT techniques. The results are well reproduced by a full optical Bloch equation model, which takes into account all the hyperfine levels involved. Subsequently, the EIT setup was used to characterize a custom MW cylindrical lens, which increases the field at the focus by a factor of three, decreasing the minimum measurable MW electric field by the same amount. Our results indicate that the combination of polarization spectroscopy and a MW lens may enhance MW electrometry, and may allow its use as a secondary standard.
引用
收藏
页数:12
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