Out-of-focus background subtraction for fast structured illumination super-resolution microscopy of optically thick samples

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Laboratoire de physique et d'tude des matériaux, CNRS UMR 8213, ESPCI ParisTech, 10 rue Vauquelin, Paris [1 ]
75005, France
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75005, France
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75014, France
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75015, France
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75005, France
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J. Microsc. | / 3卷 / 257-268期
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