Semantic models in process monitoring: Semantic models for field device performance monitoring in the process industry in the context of industry 4.0

被引：0

作者：

Hana R. ^{[1
]}

Kleinert T. ^{[1
]}

机构：

[1] Chair of Information and Automation Systems for Process and Material Technology, RWTH Aachen University, Aachen

来源：

VDI Berichte | 2023年 / 2023卷 / 2419期

关键词：

Compendex;

D O I：

10.51202/9783181024195-233

中图分类号：

学科分类号：

摘要：

The introduction of numerous semantic models (e.g. Asset administration shells (AAS) and AutomationML (AML) models) has facilitated the description of different aspects of production in the process industry. Semantic models provide a flexible structure for encapsulating annotated information. The models are integrated with standardized data exchange formats (e.g. XML) which enables a wide range of automated functions. One of these functions would be field device performance assessment where the different semantic models can help in creating an assessment ecosystem for the continuous monitoring of field devices. © 2023 The Authors.

引用

页码：233 / 244

页数：11

共 18 条

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