A parallel mode confocal system using a micro-lens and pinhole array in a dual microscope configuration

被引：0

作者：

School of Electronics Engineering, Kyungpook National University, Korea, Republic of ^{[1
]}

不详 ^{[2
]}

机构：

[1] School of Electronics Engineering, Kyungpook National University

[2] Department of Information and Communication Engineering, Sunmoon University

来源：

J. Inst. Control Rob. Syst. | 2013年 / 11卷 / 979-983期

关键词：

Massive parallel system; Micro bump inspection; Micro lens array; Micro pinhole array; Multi confocal system;

D O I：

10.5302/J.ICROS.2013.13.9032

中图分类号：

学科分类号：

摘要：

The three-dimensional measurement method of confocal systems is a spot scanning method which has a high resolution and good illumination efficiency. However, conventional confocal systems had a weak point in that it has to perform XY axis scanning to achieve FOV (Field of View) vision through spot scanning. There are some methods to improve this problem involving the use of a galvano mirror [1], pin-hole array, etc. Therefore, in this paper we propose a method to improve a parallel mode confocal system using a micro-lens and pin-hole array in a dual microscope configuration. We made an area scan possible by using a combination MLA (Micro Lens Array) and pin-hole array, and used an objective lens to improve the light transmittance and signalto-noise ratio. Additionally, we made it possible to change the objective lens so that it is possible to select a lens considering the reflection characteristic of the measuring object and proper magnification. We did an experiment using 5X, 2.3X objective lens, and did a calibration of height using a VLSI calibration target. © ICROS 2013.

引用

页码：979 / 983

页数：4

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