PUF based on chip comparison technique for trustworthy scan design data security against side channel attack

被引：0

作者：

Mukkath S.I. ^{[1
]}

Devi N.M. ^{[1
]}

机构：

[1] Department of Electronics and Communication Engineering, Amrita School of Engineering, Amrita Vishwa Vidyapeetham, Coimbatore

来源：

International Journal of Cloud Computing | 2023年 / 12卷 / 2-4期

关键词：

automatic reconfiguration; data security; design for testing; DFT; hardware as a service; on chip comparison; physical unclonable function; PUF; security;

D O I：

10.1504/IJCC.2023.130899

中图分类号：

学科分类号：

摘要：

All fields of computational technology, including cloud computing and cryptography, are vulnerable to different types of external threads. Scan-based testing method is a well-known tool for testing integrated chips, but at the same time, it helps hacking the secret code from the chip. The scan hardware can act as a platform for attackers to hack the secret data from the chip. Most of the existing solutions are based on the alteration of the conventional scan structure with more complex design which focused only on security but violates the testability. In this paper, we propose a dynamic reconfiguration architecture using embedded PUF design, which protects the chip from brute force attack, hamming distance-based attack with optimal deployment configuration. Additional on-chip comparison and masking were also used to enhance security. The experimental results are evaluated on standard benchmark circuits. Copyright © 2023 Inderscience Enterprises Ltd.

引用

页码：201 / 223

页数：22

共 26 条

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