On Measurements of the Refractive Index Dispersion in Porous Silicon

被引：0
|
作者：
Strashnikova, M.I. [1 ]
机构：
[1] Institute of Physics, Natl. Academy of Sciences of Ukraine, Kiev 03028, Ukraine
来源：
Optics and Spectroscopy (English translation of Optika i Spektroskopiya) | 2002年 / 93卷 / 01期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Fabry-Perot interferometers - Refractive index - Spectrographs - Thin films
引用
收藏
页码：132 / 135
相关论文
共 50 条
  • [41] Ab-initio determination of porous silicon refractive index confirmed by infrared transmittance measurements of an omnidirectional multilayer reflector
    Palavicini, Alessio
    Wang, Chumin
    APPLIED PHYSICS B-LASERS AND OPTICS, 2018, 124 (04):
  • [42] Ab-initio determination of porous silicon refractive index confirmed by infrared transmittance measurements of an omnidirectional multilayer reflector
    Alessio Palavicini
    Chumin Wang
    Applied Physics B, 2018, 124
  • [43] BINARY SILICA OPTICAL FIBERS - REFRACTIVE-INDEX AND PROFILE DISPERSION MEASUREMENTS
    PRESBY, HM
    KAMINOW, IP
    APPLIED OPTICS, 1976, 15 (12): : 3029 - 3036
  • [44] INTERFERENCE METHOD OF REFRACTIVE INDEX DISPERSION MEASUREMENTS IN THIN SOLID LAYERS.
    Opara, Tadeusz
    Baran, Jan W.
    Zmija, Jozef
    1600, (18): : 1 - 2
  • [45] Determination of the complex refractive index of free-standing porous silicon and oxidized porous silicon in the Visible and Ultraviolet range
    Jimenez-Vivanco, Maria R.
    Lugo, Eduardo
    Torres-Costa, Vicente
    Martin-Palma, Raul J.
    Santana, Maricela
    Herrera, Raul
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2024, 130 (12):
  • [46] Porous silicon multilayer stack for sensitive refractive index determination of pure solvents
    Volk, J
    Le Grand, T
    Bársony, I
    Gombköto, J
    Ramsden, JJ
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (08) : 1313 - 1317
  • [47] Optical devices from porous silicon having continuously varying refractive index
    Ilyas, S.
    Gal, M.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (Suppl 1) : S61 - S64
  • [48] Sensitivity of the optical properties of porous silicon layers to the refractive index of liquid in the pores
    Anderson, MA
    Tinsley-Bown, A
    Allcock, P
    Perkins, EA
    Snow, P
    Hollings, M
    Smith, RG
    Reeves, C
    Squirrell, DJ
    Nicklin, S
    Cox, TI
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2003, 197 (02): : 528 - 533
  • [49] Simultaneous Refractive Index Sensing Using an Array of Suspended Porous Silicon Membranes
    Martin-Sanchez, David
    Angelova, Todora
    Garcia-Ruperez, Jaime
    IEEE SENSORS JOURNAL, 2020, 20 (15) : 8497 - 8504
  • [50] Nonlinear refractive index change in porous silicon Fabry-Perot resonators
    Takahashi, M
    Toriumi, Y
    Matsumoto, T
    Masumoto, Y
    Koshida, N
    ADVANCED LUMINESCENT MATERIALS AND QUANTUM CONFINEMENT, 1999, 99 (22): : 35 - 42
12345