On Measurements of the Refractive Index Dispersion in Porous Silicon

被引：0
|
作者：
Strashnikova, M.I. [1 ]
机构：
[1] Institute of Physics, Natl. Academy of Sciences of Ukraine, Kiev 03028, Ukraine
来源：
Optics and Spectroscopy (English translation of Optika i Spektroskopiya) | 2002年 / 93卷 / 01期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Fabry-Perot interferometers - Refractive index - Spectrographs - Thin films
引用
收藏
页码：132 / 135
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