High-resolution imaging and analysis of light metal samples using ultrahigh resolution FE-SEM

被引:0
|
作者
Kanazawa T. [1 ]
Takahashi H. [1 ]
机构
[1] JEOL Ltd., Akishima-shi, 3-1-2 Musashino, Tokyo
来源
Keikinzoku/Journal of Japan Institute of Light Metals | 2023年 / 73卷 / 02期
关键词
Compendex;
D O I
10.2464/JILM.73.84
中图分类号
学科分类号
摘要
[No abstract available]
引用
收藏
页码:84 / 88
页数:4
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