Localized charge storage in CeO2/Si(111) by electrostatic force microscopy

被引：0

作者：

Jones, J.T. ^{[1
]}

Bridger, P.M. ^{[1
]}

Marsh, O.J. ^{[1
]}

McGill, T.C. ^{[1
]}

机构：

[1] California Inst of Technology, Pasadena, United States

来源：

Materials Research Society Symposium - Proceedings | 2000年 / 584卷

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摘要：

引用

页码：331 / 335

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