Localized charge storage in CeO2/Si(111) by electrostatic force microscopy

被引：0
|
作者：
Jones, J.T. [1 ]
Bridger, P.M. [1 ]
Marsh, O.J. [1 ]
McGill, T.C. [1 ]
机构：
[1] California Inst of Technology, Pasadena, United States
来源：
Materials Research Society Symposium - Proceedings | 2000年 / 584卷
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摘要：
11
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页码：331 / 335
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