International standardization of quantitative surface analysis by auger electron spectroscopy and x-ray photoelectron spectroscopy

被引：0

作者：

Tanuma, Shigeo ^{[1
]}

机构：

[1] Materials Analysis Station, National Institute for Materials Science, 1-2-1 Sengen, Tukuba, Ibaraki 305-0047, Japan

来源：

Shinku/Journal of the Vacuum Society of Japan | 2005年 / 48卷 / 04期

关键词：

20;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：261 / 264

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