Surface structural analysis of SrF2(111) using low-energy atom scattering spectroscopy

被引：0

作者：

Fukuta H. ^{[1
]}

Tan G. ^{[1
]}

Oga T. ^{[2
]}

Matsuda A. ^{[2
]}

Yoshimoto M. ^{[2
]}

Matsuura H. ^{[3
]}

Umezawa K. ^{[1
,3
]}

机构：

[1] Division of Physics, Faculty of Liberal Arts, Sciences and Global Education, Osaka Metropolitan University, 1-1 Gakuen-Cho, Naka-Ku, Sakai, Osaka

[2] Department of Materials Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 4259 Nagatsuta, Midori Kanagawa, Yokohama

[3] Department of Quantum and Radiation Eng., Graduate School of Eng., Osaka Metropolitan University, 1-1 Gakuen-Cho, Naka-Ku, Sakai, Osaka

来源：

Japanese Journal of Applied Physics | 2024年 / 63卷 / 02期

关键词：

low-energy atom scattering spectroscopy; SrF[!sub]2[!/sub; surface structure;

D O I：

10.35848/1347-4065/ad226f

中图分类号：

学科分类号：

摘要：

We studied the surface structure of SrF2(111) using low-energy atom scattering spectroscopy. For the spectroscopy, we used pulsed 3 keV 4He° and 3 keV 20Ne0 beams as incident particles and detected 180° backscattered particles using a microchannel plate. We compared the experimental results with simulations employing three types of surface atomic structural models: F-Sr-F, Sr-F-F, and F-F-Sr Our results demonstrate that the topmost layer of SrF2(111) has approximately 60% and 40% of F-Sr-F and Sr-F-F, respectively. © 2024 The Japan Society of Applied Physics.

引用

共 31 条

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