Enhanced BDD algorithm for multiple-fault diagnosis

被引:0
|
作者
Yuan, Kan [1 ]
Hu, Shou-Song [1 ]
机构
[1] College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China
来源
Kongzhi yu Juece/Control and Decision | 2010年 / 25卷 / 07期
关键词
Trees (mathematics) - Binary trees - Boolean functions - Fault detection - Fault tree analysis;
D O I
暂无
中图分类号
学科分类号
摘要
To ensure the unique structure of the final integrated binary decision diagram(BDD), two new rules are added to the connection rules of component connection approach for fault tree conversion to BDD. Through comparing the probabilities of cut sets with the same structure importance, the ordering of checking the fault source is determined. This method can be applied to multiple-fault diagnosis for digital systems with independent basic events. Because this method has no need to determine the sequence of basic events and the minimal cut sets, it's more suitable for computer execution and has higher efficiency than traditional methods of fault tree diagnosis.
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页码:1117 / 1120
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