Development of magnetic latching relay for improvement of tripping current variation under manufacturing error

被引：0
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作者：
Nakagawa, Takafumi [1 ]
机构：
[1] Advanced Technology R and D Center, Mitsubishi Electric Corporation, 8-1-1, Tsukaguchi-Honmachi, Amagasaki, Hyogo, Japan
来源：
Engineering Letters | 2013年 / 21卷 / 04期
关键词：
32;
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页码：185 / 192
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