K-GTAW process: A new welding technology combining quality and productivity

被引：2

作者：

Le, Port, P. ^{[1
]}

Laugier, M. ^{[1
]}

Scandella, F. ^{[1
]}

Lawrjaniec, D. ^{[1
]}

Boucher, Christian ^{[1
]}

机构：

[1] Institut de Soudure, France

来源：

Welding International | 2007年 / 21卷 / 06期

关键词：

D O I：

10.1080/09507110701510618

中图分类号：

学科分类号：

摘要：

No abstract available

引用

页码：430 / 441

共 50 条

[31] Color line scan technology - New tool for industrial process & quality control applications
Lemstrom, G
Paranen, P
VISION SYSTEMS: SENSORS, SENSOR SYSTEMS, AND COMPONENTS, 1996, 2784 : 126 - 135
[32] New unified process and quality vision technology helps improving paper machine profitability
Hannu, Ruuska
IPPTA: Quarterly Journal of Indian Pulp and Paper Technical Association, 2009, 21 (03) : 143 - 147
[33] High resolution orthophoto generation on laser scanning Proposal for a new technology with productivity features and quality charting standards
Ceccaroni, Francesca
GEOMEDIA, 2005, 9 (01) : 25 - 27
[34] Innovative process of polyphenol recovery from pomegranate peels by combining green deep eutectic solvents and a new infrared technology
Rajha, Hiba N.
Mhanna, Tania
El Kantar, Sally
El Khoury, Andre
Louka, Nicolas
Maroun, Richard G.
LWT-FOOD SCIENCE AND TECHNOLOGY, 2019, 111 : 138 - 146
[35] Test results of municipal waste treatment technology combining pyrolysis and high temperature combustion (new process for waste treatment)
Nakagawa, Y
Tajima, S
May, KW
Harada, Y
7TH ISWA INTERNATIONAL CONGRESS, PROCEEDINGS I, 1996, : I97 - I103
[36] Research on Regional Carbon Emission Policy and Breakthrough Green Technology Innovation Pathways: Based on the Perspective of New Quality Productivity
Zou, Fei
Hu, Yuanbo
Liu, Feng
GLOBAL NEST JOURNAL, 2024, 26 (07):
[37] Image Quality and Productivity of the New Xeikon Digital Presses using "true 1200 dpi" Multilevel Print Head Technology
Deschuytere, Frank
Lippens, Stefaan
Broddin, Dirk
NIP24/DIGITAL FABRICATION 2008: 24TH INTERNATIONAL CONFERENCE ON DIGITAL PRINTING TECHNOLOGIES, TECHNICAL PROGRAM AND PROCEEDINGS, 2008, : 803 - 806
[38] A new high-k transistor technology implemented in accordance with the 55nm design rule process
Fukase, Tadashi
Nakahara, Yasushi
Takahashi, Toshifumi
Imai, Kiyotaka
NEC TECHNICAL JOURNAL, 2006, 1 (05): : 42 - 46
[39] BETTER WELD QUALITY IN ULTRASONIC WELDING - FORCE CONTROL USING SERVOVALVE OPENS UP NEW APPROACHES OF PROCESS-CONTROL
MICHAELI, W
KORTE, W
KUNSTSTOFFE-GERMAN PLASTICS, 1993, 83 (09): : 667 - 670
[40] On the ideal quality control specification of compound prescriptionTaking thought for the new ingredients produced in the single drugs combining process in compound prescription
Jian-li Liu
Chinese Journal of Integrated Traditional and Western Medicine, 2002, 8 (2): : 139 - 141

← 1 2 3 4 5 →