Microscopic phase-shifting profilometry based on digital micromirror device technology

被引：0
|
作者：
Zhang, Chengping [1 ]
Huang, Peisen S. [1 ]
Chiang, Fu-Pen [1 ]
机构：
[1] Department of Mechanical Engineering, State Univ. New York at Stony Brook, Stony Brook, NY 11794-2300, United States
来源：
Applied Optics | 2002年 / 41卷 / 28期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：5896 / 5904
相关论文
共 50 条
  • [21] Phase-shifting error and its elimination in phase-shifting digital holography
    Guo, CS
    Zhang, L
    Wang, HT
    Liao, J
    Zhu, YY
    OPTICS LETTERS, 2002, 27 (19) : 1687 - 1689
  • [22] Phase-shifting method with unknown intervals in phase-shifting digital holography
    Kita, T.
    Morimoto, Y.
    Fujigaki, M.
    Matui, T.
    Advances in Experimental Mechanics IV, 2005, 3-4 : 211 - 216
  • [23] An improved complementary gray code combined with phase-shifting profilometry based on phase adjustment
    Han, Shuhuan
    Yang, Yanxi
    Zhang, Xinyu
    Zhao, Xubo
    Li, Xinjie
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2025, 36 (03)
  • [24] Nonlinear self-calibration method based on phase registration in phase-shifting profilometry
    Xia, Zeheng
    Hou, Peiguo
    Song, Tao
    Li, Qian
    OPTICS AND LASER TECHNOLOGY, 2023, 167
  • [25] A novel phase-recovering algorithm for the intensity quantization error in the digital grating phase-shifting profilometry
    Hu, Eryi
    Hu, Yuan
    Fang, Haifeng
    OPTIK, 2011, 122 (24): : 2227 - 2229
  • [26] Phase-shifting digital holography
    Yamaguchi, I
    Zhang, T
    OPTICS LETTERS, 1997, 22 (16) : 1268 - 1270
  • [27] The spatial phase-shifting measuring profilometry based on dual-frequency grating
    An, Haihua
    Cao, Yiping
    Wu, Haitao
    Zhang, Hechen
    Li, Hongmei
    OPTICS AND LASERS IN ENGINEERING, 2021, 143
  • [28] Few-fringe-based phase-shifting profilometry employing hilbert transform
    Xu, Peng
    Liu, Jintao
    Zhang, Wen
    Shan, Shuo
    Wang, Jianhua
    Shao, Mingwei
    Deng, Zhaopeng
    PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2023, 83 : 1 - 11
  • [29] The spatial phase-shifting measuring profilometry based on dual-frequency grating
    An, Haihua
    Cao, Yiping
    Wu, Haitao
    Zhang, Hechen
    Li, Hongmei
    Cao, Yiping (ypcao@scu.edu.cn), 1600, Elsevier Ltd (143):
  • [30] Crosstalk Suppression for Color Phase-Shifting Profilometry Based on Chord Distribution Equalization
    Cai, Bolin
    Tong, Chenen
    Wu, Qiujie
    Chen, Xiangcheng
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 72
12345