Summary of integrated diagnostics and prognostics method based on testability for electronic system

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机构：
[1] Deng, Sen
[2] Jing, Bo
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Deng, S. (425931056@qq.com) | 1600年 / Northeast University卷 / 28期
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Compilation and indexing terms; Copyright 2024 Elsevier Inc;
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摘要：
Health - Fault detection - Signal processing - Systems engineering
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