Development of dimensional X-ray computed tomography

被引:0
作者
National Metrology Institute of Japan , National Institute of Advanced Industrial Science and Technology , 1-1-1 Umezono, Tsukuba [1 ]
Ibaraki
305-8563, Japan
机构
[1] National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, 305-8563, Ibaraki
来源
Int. J. Autom. Technol. | / 5卷 / 567-571期
关键词
Dimensional measurement; Industrial standards; Reference gauge; X-ray computed tomography;
D O I
10.20965/ijat.2015.p0567
中图分类号
学科分类号
摘要
Recently, a strong need has arisen for a dimensional X-ray computed tomography system that is capable of dimensionalmeasurements. This is because the speedy realization of dimensional measurements for outward forms and inward forms on dense spatial points remarkably simplifies and accelerates production loop. However, although the image obtained via XCT describes the structure clearly and in great detail, dimensional metrology by means of XCT is not simple. The National Metrology Institute of Japan has been carrying out performance tests using gauges that include the gauges proposed in ISO10360. In this work, the magnification variation correction is carefully presented, and a maximum deviation of less than 5 μm is shown to be possible by means of the measurement of the forest phantom of 27 ruby spheres, the locations of which are calibrated by the coordinate measuring machine. © 2015, Fuji Technology Press. All rights reserved.
引用
收藏
页码:567 / 571
页数:4
相关论文
共 50 条
  • [31] MICRO X-RAY COMPUTED TOMOGRAPHY OF ADHESIVE BONDS IN WOOD
    McKinley, P. E.
    Ching, D. J.
    Kamke, F. A.
    Zauner, M.
    Xiao, X.
    WOOD AND FIBER SCIENCE, 2016, 48 : 2 - 16
  • [32] X-ray computed tomography using curvelet sparse regularization
    Wieczorek, Matthias
    Frikel, Juergen
    Vogel, Jakob
    Eggl, Elena
    Kopp, Felix
    Noel, Peter B.
    Pfeiffer, Franz
    Demaret, Laurent
    Lasser, Tobias
    MEDICAL PHYSICS, 2015, 42 (04) : 1555 - 1565
  • [33] Characterization of Coloured Gemstones by X-ray Micro Computed Tomography
    Heyn, Rene
    Rozendaal, Abraham
    Du Plessis, Anton
    Mouton, Carene
    MINERALS, 2021, 11 (02) : 1 - 16
  • [34] Contrast agents for soil investigation with X-ray computed tomography
    Van Loo, Denis
    Bouckaert, Liesbeth
    Leroux, Olivier
    Pauwels, Elin
    Dierick, Manuel
    Van Hoorebeke, Luc
    Cnudde, Veerle
    De Neve, Stefaan
    Sleutel, Steven
    GEODERMA, 2014, 213 : 485 - 491
  • [35] Quantifying neutron scintillator screens with X-ray computed tomography
    Chuirazzi, William
    Cool, Steven
    Craft, Aaron
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2024, 1063
  • [36] The Use of X-Ray Computed Tomography to Characterize Microdamage in Asphalt
    Khan, Rawid
    Collop, Andrew C.
    ROAD MATERIALS AND PAVEMENT DESIGN, 2010, 11 : 89 - 109
  • [37] Molecular X-ray computed tomography of myelin in a rat brain
    Jensen, T. H.
    Bech, M.
    Bunk, O.
    Menzel, A.
    Bouchet, A.
    Duc, G. Le
    Feidenhans'l, R.
    Pfeiffer, F.
    NEUROIMAGE, 2011, 57 (01) : 124 - 129
  • [38] Study of CdTe and CdZnTe detectors for X-ray computed tomography
    Ricq, S
    Glasser, F
    Garcin, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 458 (1-2) : 534 - 543
  • [39] Bismuth chelate as a contrast agent for X-ray computed tomography
    Ji-jun Fu
    Jun-jie Guo
    Ai-ping Qin
    Xi-yong Yu
    Qiang Zhang
    Xue-ping Lei
    Yu-gang Huang
    Ming-yue Chen
    Jie-xia Li
    Yu Zhang
    Jing-ping Liu
    Yuan-ye Dang
    Dan Wu
    Xiao-ya Zhao
    Zhong-xiao Lin
    Yin-lei Lin
    Song-pei Li
    Ling-yan Zhang
    Journal of Nanobiotechnology, 18
  • [40] X-ray flat-panel detector geometry correction to improve dimensional computed tomography measurements
    Luethi, Melina
    Bircher, Benjamin A.
    Meli, Felix
    Kueng, Alain
    Thalmann, Rudolf
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2020, 31 (03)