Kinetic Monte Carlo model of silicon CVD growth from a mixed H2/SiH4 gas source

被引:0
|
作者
Fearn, M. [1 ]
Sayed, M. [1 ]
Jefferson, J.H. [1 ]
Robbins, D.J. [1 ]
机构
[1] DERA, Worcestershire, United Kingdom
来源
Materials Research Society Symposium - Proceedings | 2000年 / 584卷
关键词
Adsorption - Chemical vapor deposition - Computational fluid dynamics - Computer simulation - Desorption - Hydrogen - Monte Carlo methods - Partial pressure - Silanes - Temperature;
D O I
暂无
中图分类号
学科分类号
摘要
We report the development of an atomistic scale Kinetic Monte Carlo model of silicon CVD growth. By employing a variable time step algorithm, simulations have been performed over a range of time scales, enabling direct comparison with experimental data. The validity of using the kinetic theory of gases for evaluating steady state incoming particle fluxes within the model is demonstrated by comparison with computational fluid dynamics simulations. The model is applied to study hydrogen desorption rates from Si(001) and the dependence of silicon growth rate on substrate temperature, with results found to be in good agreement with experimental data. An experimentally observed decrease of growth rate with increasing H2 partial pressure is also reproduced by the model and shown to be caused by a decrease in silane adsorption on a hydrogen-rich surface.
引用
收藏
页码:257 / 261
相关论文
共 50 条
  • [21] Role of SiH4 gas heating in the growth of hydrogenated microcrystalline silicon
    Arai, T.
    Shirai, H.
    1996, JJAP, Minato-ku (35):
  • [22] A kinetic simulation of the effect of frequency on the power dissipation in VHF SiH4/H2 discharges
    Yan, M
    Goedheer, WJ
    CZECHOSLOVAK JOURNAL OF PHYSICS, 1998, 48 : 257 - 262
  • [23] Modeling of the formation of cationic silicon clusters in a remote Ar/H2/SiH4 plasma
    Leroux, A
    Kessels, WMM
    Schram, DC
    van de Sanden, MCM
    JOURNAL OF APPLIED PHYSICS, 2000, 88 (01) : 537 - 543
  • [24] Effect of H2 dilution on the surface composition of plasma-deposited silicon films from SiH4
    Marra, DC
    Edelberg, EA
    Naone, RL
    Aydil, ES
    APPLIED SURFACE SCIENCE, 1998, 133 (1-2) : 148 - 151
  • [25] Modeling of the formation of cationic silicon clusters in a remote Ar/H2/SiH4 plasma
    Leroux, A.
    Kessels, W.M.M.
    Schram, D.C.
    van de Sanden, M.C.M.
    1600, American Inst of Physics, Woodbury, NY, USA (88):
  • [26] Growth mechanisms study of microcrystalline silicon deposited by SiH4/H2 plasma using tailored voltage waveforms
    Bruneau, B.
    Wang, J.
    Dornstetter, J. -C.
    Johnson, E. V.
    JOURNAL OF APPLIED PHYSICS, 2014, 115 (08)
  • [27] A plasma chemistry model for H2/SiH4 mixtures used in PECVD processes
    Sushkov, Vladimir
    Rachdi, Lazhar
    Hofmann, Marc
    PHYSICA SCRIPTA, 2023, 98 (05)
  • [28] SELECTIVE SILICON EPITAXIAL-GROWTH AT 800-DEGREES-C BY ULTRALOW-PRESSURE CHEMICAL VAPOR-DEPOSITION USING SIH4 AND SIH4/H2
    YEW, TR
    REIF, R
    JOURNAL OF APPLIED PHYSICS, 1989, 65 (06) : 2500 - 2507
  • [29] H2 dilution effect in the Cat-CVD processes of the SiH4/NH3 system
    Ansari, SG
    Umemoto, H
    Morimoto, T
    Yoneyama, K
    Izumi, A
    Masuda, A
    Matsumura, H
    THIN SOLID FILMS, 2006, 501 (1-2) : 31 - 34
  • [30] Tetramer formation on Si(100)-(2×1) during CVD growth from SiH4
    Universitaet Ulm, Ulm, Germany
    Surf Sci, 1-3 (1001-1005):