Fabrication and evaluation of nanometer-sized metal oxide structures on composite metal thin films using scanning near-field optical microscope

被引:0
|
作者
Onuki, Teppei [1 ,2 ]
Watanabe, Yuuichi [2 ]
Nishio, Keishi [2 ]
Tsuchiya, Toshio [2 ]
Tani, Toshirou [3 ]
Tokizaki, Takashi [1 ]
机构
[1] Nanotechnology Research Institute, National Institute of AIST, Tsukuba, Ibaraki 305-8568, Japan
[2] Dept. of Mat. Sci. and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan
[3] Department of Applied Physics, Tokyo Univ. of Agric. and Technology, Koganei, Tokyo 184-8588, Japan
来源
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2002年 / 41卷 / 10期
关键词
Composite materials - Metallic films - Nanotechnology - Optical microscopy - Oxidation - Semiconductor device manufacture - Semiconductor device structures - Thickness measurement - Titanium alloys - Transparency;
D O I
10.1143/jjap.41.6256
中图分类号
学科分类号
摘要
Nanometer-scale metal-oxide structures with optical transparency have been fabricated on metal films by anodic oxidation using a probe tip of a scanning near-field optical microscope (SNOM). We discuss the thickness and the optical transparency of the oxides depending on the bias voltage applied to samples for oxidation. For titanium (Ti) films, the thickness of the oxide increases up to 100 nm linearly with the bias voltage. For composite films consisting of titanium-aluminum (Ti-Al) and titanium-silver (Ti-Ag) layers, the bias-voltage dependence of the oxide thickness is altered at some bias voltages, which concur with those required for the oxidation of the upper Ti layers. Moreover, the oxides have been observed optically by the same SNOM as a transmission mode. The transmittance at the oxide increases with the growth of the oxides, because of the decrease of the thickness of the metal films due to the oxidation. The result also suggests that Ti-, Al- and Ag-oxides fabricated by this method are optically transparent.
引用
收藏
页码:6256 / 6263
相关论文
共 50 条
  • [1] Fabrication and evaluation of nanometer-sized metal oxide structures on composite metal thin films using scanning near-field optical microscope
    Onuki, T
    Watanabe, Y
    Nishio, K
    Tsuchiya, T
    Tani, T
    Tokizaki, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (10): : 6256 - 6263
  • [2] Observation of Nanometer-sized Structures Using a Seaming Near-field Optical Microscope (SNOM)
    Tang Ming
    Min, Ouyang
    Min, Cai Sheng
    Xue Zengquan
    Liu Zhongfan
    ACTA PHYSICO-CHIMICA SINICA, 1997, 13 (07) : 669 - 672
  • [3] Nanometer-sized optical waveguides fabricated by anodic oxidation using a scanning near-field optical microscope
    Onuki, T
    Tokizaki, T
    Watanabe, Y
    Tsuchiya, T
    Tani, T
    APPLIED PHYSICS LETTERS, 2002, 80 (24) : 4629 - 4631
  • [4] Scanning near-field optical microscope with a laser diode and nanometer-sized bit recording
    Hosaka, S
    Shintani, T
    Miyamoto, M
    Hirotsune, A
    Terao, M
    Yoshida, M
    Honma, S
    Kammer, S
    THIN SOLID FILMS, 1996, 273 (1-2) : 122 - 127
  • [5] Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode
    Hosaka, S
    Shintani, T
    Miyamoto, M
    Hirotsune, A
    Terao, M
    Yoshida, M
    Fujita, K
    Kammer, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (1B): : 443 - 447
  • [6] Light propagation through nanometer-sized structures: the two-dimensional-aperture scanning near-field optical microscope
    Novotny, L.
    Pohl, D.W.
    Regli, P.
    Journal of the Optical Society of America A: Optics and Image Science, and Vision, 1994, 11 (06): : 1768 - 1779
  • [7] Fabrication and evaluation of nanometer-size waveguide using scanning near-field optical microscope
    Onuki, T
    Watanabe, N
    Tani, T
    Tokizaki, T
    CLEO(R)/PACIFIC RIM 2001, VOL I, TECHNICAL DIGEST, 2001, : 518 - 519
  • [8] LIGHT-PROPAGATION THROUGH NANOMETER-SIZED STRUCTURES - THE 2-DIMENSIONAL-APERTURE SCANNING NEAR-FIELD OPTICAL MICROSCOPE
    NOVOTNY, L
    POHL, DW
    REGLI, P
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1994, 11 (06): : 1768 - 1779
  • [9] Near-field scanning optical micro probe integrated with a nanometer-sized light emitting diode
    Hoshino, Kazunori
    Rozanski, Lynn
    Bout, David A. Vanden
    Zhang, Xiaojing
    PROCEEDINGS OF THE IEEE TWENTIETH ANNUAL INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, VOLS 1 AND 2, 2007, : 678 - +
  • [10] Nanometer scale polarimetry studies using a near-field scanning optical microscope
    McDaniel, EB
    McClain, SC
    Hsu, JWP
    APPLIED OPTICS, 1998, 37 (01) : 84 - 92