Phase retardation measurement of wave plates based on the self-calibration method

被引：4

作者：

Hou, Junfeng ^{[1
]}

Yu, Jia ^{[1
]}

Wang, Dongguang ^{[1
]}

Deng, Yuanyong ^{[1
]}

Zhang, Zhiyong ^{[1
]}

Sun, Yingzi ^{[1
]}

机构：

[1] Key Laboratory of Solar Activity, National Astronomical Observatories, Chinese Academy of Sciences

来源：

Zhongguo Jiguang/Chinese Journal of Lasers | 2012年 / 39卷 / 04期

关键词：

Dichroism; Measurement; Phase retardation; Self-calibration; Wave plate;

D O I：

10.3788/CJL201239.0408007

中图分类号：

学科分类号：

摘要：

Based on the rotating-compensator ellipsometry (RCE), a method of phase retardation measurement of wave plates based on the self-calibration method is presented. The new method takes retardation of compensator as an unknown parameter, constructs four nonlinear equations, and calculates the retardation of wave plates under test. The method uses the self-calibration of compensator to eliminate the systematic error caused by its retardation's inaccurate calibration. Especially, it is more convenient for retardation measurement in many wavelengths. Based on this, the measuring accuracy of system is analyzed and simulated. It is found that the maximal systematic error and random error are 0.036° and 0.04°, respectively, over all the samples. Besides, a quarter wave plate (QWP), a half wave plate (HWP), a 127° wave plate and the air (without sample) are measured at 517.3, 525.0 and 532.4 nm, respectively, to evaluate the performance of the system, where the retardation of air indicates the measuring accuracy of the system, and is consistent with error analysis.

引用

共 19 条

[1]

Williams P.A., Rose A.H., Wang C.M., Rotating-polarizer polarimeter for accurate retardance measurement, Appl. Opt., 36, 25, pp. 6466-6472, (1997)

[2]

den Boer J.H.W.G., Kroesen G.M.W., de Hoog F.J., Spectroscopic rotating compensator ellipsometry in the infrared: Retarder design and measurement, Meas. Sci. Technol., 8, 5, pp. 484-492, (1997)

[3]

Dill, Rotating-compensator ellipsometer, (1977)

[4]

Shyu L., Chen C., Su D., Method for measuring the retardation of a wave plate, Appl. Opt., 32, 22, pp. 4228-4230, (1993)

[5]

Li F., Han J., Zeng A., Et al., Method for measuring retardation by swinging quarter-wave plate with phase modulator, Chinese J. Lasers, 38, 2, (2011)

[6]

Wang J., Chen L., Wu Q., Et al., Retardation measurement of wave plate using white-light Michelson interferometer, Chinese J. Lasers, 38, 5, (2011)

[7]

Oakberg T., Measurement of waveplate retardation using a photoelastic modulator, SPIE, 3121, pp. 19-22, (1997)

[8]

Wang B., Oakberg T.C., A new instrument for measuring both the magnitude and angle of low level linear birefringence, Rev. Sci. Instrum., 70, 10, pp. 3847-3854, (1999)

[9]

Su M., Song L., Li Y., Et al., Compensation method for measuring wave plates, Applied Lasers, 10, 5, pp. 220-222, (1990)

[10]

Yun M., Li G., Phase retardation measurement with λ/4 wave-plate, Laser Technology, 25, 5, pp. 328-330, (2001)

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