Investigation of nanoscale electronic properties of CdZnTe crystals by scanning spreading resistance microscopy

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作者：

Department of Electrical Engineering, University of South Carolina, Columbia, SC 29208, United States ^{[1
]}

不详 ^{[2
]}

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来源：

Semicond Sci Technol | / 4卷

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D O I：

045012

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摘要：

Thermionic emission - Z transforms - Cadmium alloys - Doping (additives) - II-VI semiconductors - Electronic properties - Semiconductor alloys

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