Cross-sectional electrostatic force microscopy of thin-film solar cells

被引:0
|
作者
Ballif, C.
Moutinho, H.R.
Al-Jassim, M.M.
机构
[1] National Renewable Energy Laboratory, Golden, CO 80401, United States
[2] Fraunhofer ISE, Oltmanstrasse 5, D-79100 Freiburg, Germany
来源
| 1600年 / American Institute of Physics Inc.卷 / 89期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Cross-sectional electrostatic force microscopy of thin-film solar cells
    Ballif, C
    Moutinho, HR
    Al-Jassim, MM
    JOURNAL OF APPLIED PHYSICS, 2001, 89 (02) : 1418 - 1424
  • [2] Cross-sectional characterization of thin-film transistors with transmission electron microscopy
    Tsuji, S.
    Tanaka, M.
    Iwama, H.
    Tsutsui, N.
    Kuroda, K.
    Saka, H.
    Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 1995, 13 (03): : 1353 - 1357
  • [3] CROSS-SECTIONAL CHARACTERIZATION OF THIN-FILM TRANSISTORS WITH TRANSMISSION ELECTRON-MICROSCOPY
    TSUJI, S
    TANAKA, M
    IWAMA, H
    TSUTSUI, N
    KURODA, K
    SAKA, H
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (03): : 1353 - 1357
  • [4] Characterization of heterointerfaces in thin-film transistors by cross-sectional transmission electron microscopy
    Kuroda, K
    Tsuji, S
    Hayashi, Y
    Saka, H
    ATOMIC RESOLUTION MICROSCOPY OF SURFACES AND INTERFACES, 1997, 466 : 67 - 72
  • [5] Cross-sectional electrostatic force microscopy of semiconductor laser diodes
    A. V. Ankudinov
    E. Yu. Kotel’nikov
    A. A. Kantsel’son
    V. P. Evtikhiev
    A. N. Titkov
    Semiconductors, 2001, 35 : 840 - 846
  • [6] Cross-sectional electrostatic force microscopy of semiconductor laser diodes
    Ankudinov, AV
    Kotel'nikov, EY
    Kantsel'son, AA
    Evtikhiev, VP
    Titkov, AN
    SEMICONDUCTORS, 2001, 35 (07) : 840 - 846
  • [7] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF THIN-FILM POLYCRYSTALLINE SEMICONDUCTORS BY CONVENTIONAL MICROTOMY
    ALBUYARON, A
    FRANK, A
    NOUFI, R
    THIN SOLID FILMS, 1993, 227 (01) : 18 - 23
  • [8] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF X-RAY MULTILAYER THIN-FILM STRUCTURES
    NGUYEN, TD
    GRONSKY, R
    KORTRIGHT, JB
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1991, 19 (04): : 473 - 485
  • [9] Cross-sectional atomic force microscopy imaging of polycrystalline thin films
    Ballif, C
    Moutinho, HR
    Hasoon, FS
    Dhere, RG
    Al-Jassim, MM
    ULTRAMICROSCOPY, 2000, 85 (02) : 61 - 71
  • [10] Thin-film solar cells
    Aberle, Armin G.
    THIN SOLID FILMS, 2009, 517 (17) : 4706 - 4710